VAI Test Handler

 
THROUGHPUT  
Very High System Throughput
Fast Index Time
Quick Changeover
High First Pass Yield
     -  Unique Device Plunging
     -  Unique Device Alignment
 
USER INTERFACING
Operation
Ergonomic Tray Height
Intuitive Graphical Screen
Local Language Prompting available
Maintenance
Socket in easy reach
Intuitive Graphical Screen
Small Footprint
 
Copyright © 2010 VA Innovation Pte Ltd. All rights reserved